Ambios XP-2 Stylus Profilometer
![](/documents/1676477/1986547/iLabAmbios.jpg/8ccd2f0d-5b68-8060-21f5-710b1de7fbd2?t=1663576082860)
Ambios XP-2 Stylus Profilometer
For fast 3D measurements of surface morphology on the mm size scale; max z range 25 mm, z resolution 1 nm.
The instrument can be accessed, upon training, from the booking system.
Make a reservation (booking system)
Person in charge
![](/o/iit-theme/images/man.png)
Materials Characterization