Asylum Research MFP-3D
Asylum Research MFP-3D
AFM system for general-purpose topological and mechanical characterization, equipped also for the measurement of electrical properties of materials, with ORCA module for conductive AFM, and AMFM loss tangent mapping.
Access to the instrument is limited, to arrange measurements please contact Dr. Marco Salerno.
Person in charge
Nanoscopy & NIC@IIT